JEOL JXA-8530F (Field-Emission Electron Probe Microanalyzer; FE-EPMA) + Probe Software

- 5 spectrometers + EDS

• CH-1: LDE2H, TAPH
• CH-2: LDE1, TAP
• CH-3: PETL, LIFL
• CH-4: PETJ, LIF
• CH-5: PETH, LIFH

- Quantitative analysis, X-ray elemental mapping (WDS + EDS)

 

<False color X-ray maps>

 

JEOL JSM-7200F-LV (Low Vacuum Field Emission Scanning Electron Microscope)

- Semi-quantitative analysis, X-ray elemental mapping (Oxford EDS)

- Mineral identification, mapping (Oxford EBSD; Symmetry S2)

- Non-conductive sample analysis

 

 

 

JEOL JSM-6610 (Scanning Electron Microscope; SEM)

- Qualitative analysis, X-ray mapping (EDS)

- Zoning image (CL)

 

Thin section storage room

 

Isotope ratio mass spectrometer (MAT 253 Plus) with a CO₂ laser BrF₅ fluorination system

Lasing obsidian lab standard in the chamber filled with BrF5

 

Modified-VG5400/MS-3 mass spectrometer for noble gas study